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Despite tremendous efforts in analog layout automation, little adoption has been demonstrated in practical design flows. Traditional analog layout synthesis tools use various heuristic constraints to prune the design space to ensure post layout performance. However, these approaches provide limited guarantee and poor generalizability due to a lack of model mapping layout properties to circuit performance. In this paper, we attempt to shorten the gap in post layout performance modeling for analog circuits with a quantitative statistical approach. We leverage a state-of-the-art automatic analog layout tool and industry-level simulator to generate labeled training data in an automated manner. We propose a 3D convolutional neural network (CNN) model to predict the relative placement quality using well-crafted placement features. To achieve data-efficiency for practical usage, we further propose a transfer learning scheme that greatly reduces the amount of data needed. Our model would enable early pruning and efficient design explorations for practical layout design flows. Experimental results demonstrate the effectiveness and generalizability of our method across different operational transconductance amplifier (OTA) designs. 

Symmetry and matching between critical building blocks have a significant impact on analog system performance. However, there is limited research on generating system level symmetry constraints. In this paper, we propose a novel method of detecting system symmetry constraints for analog circuits with graph similarity. Leveraging spectral graph analysis and graph centrality, the proposed algorithm can be applied to circuits and systems of large scale and different architectures. To the best of our knowledge, this is the first work in detecting system level symmetry constraints for analog and mixed-signal (AMS) circuits. Experimental results show that the proposed method can achieve high accuracy of 88.3% with low false alarm rate of less than 1.1% in largescale AMS designs.